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METHOD AND APPARATUS FOR MEASURING THE REFLECTION

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专利名称:METHOD AND APPARATUS FOR

MEASURING THE REFLECTION PROPERTIESOF A REFLECTOR

发明人:PEDRETTI-RODI, ANDREA申请号:EP12708493.7申请日:20120130公开号:EP2668453A2公开日:20131204

摘要:The invention comprises a method and a device for measuring a reflector forradiation during the operation thereof, in which to determine the current reflectionproperties of the reflector in a number of at least one measurement points provided inthe path of the radiation reflected by the reflector, the pattern of predeterminedcharacteristics of the currently reflected radiation is measured and compared with apredetermined reference pattern, wherein the current geometrical properties of thereflector are inferred from the comparison and in the event of undesired geometricalproperties, appropriate operational parameters of the reflector are modified. Thismethod is preferably applied in trough collectors for solar power plants, in order tomeasure flexible concentrators arranged in a pressure cell, during their operation.

申请人:AIRLIGHT ENERGY IP SA

地址:Via Croce 1 6710 Biasca CH

国籍:CH

代理机构:Stump, Beat

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