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专利名称：INTEGRATED CIRCUIT TESTING发明人：TOMIHIRO SUZUKI申请号：AU2275083申请日：19831221公开号：AU2275083A公开日：19840628
摘要：Monolithic microwave integrated circuits with resistance-capacitance couplinginclude bonding or terminal pads 20, 22, 26, 27 and 28 such as pads for signals, for apower source, and for bias potentials. In addition contact pads 21, 23, 24 and 25 areprovided to enable the direct current characteristics of the circuit to be measured. Thesecontact pads 21, 23, 24 and 25 can be contacted by probes when the circuit still formspart of a wafer to enable circuits with the required direct current characteristics to beselected for final assembly and packaging. The contact pads 21, 23, 24 and 25 areprovided by opening up contact windows over eiectrically conducting pans of the circuitelements such as over metal electrodes of capacitors 5, 6, 7 and 9 which avoids the needto add to the area of the electrical conductors and hence enables the selection to beperformed without sacrificing or impairing the high frequency characteristics of thecircuit.
申请人：SUMITOMO ELECTRIC INDUSTRIES LTD.
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