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METHODS AND SYSTEMS FOR IMPROVED MEASUREMENT, ENTI

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专利名称:METHODS AND SYSTEMS FOR IMPROVED

MEASUREMENT, ENTITY AND PARAMETERESTIMATION, AND PATH PROPAGATIONEFFECT MEASUREMENT AND MITIGATIONIN SOURCE SIGNAL SEPARATION

发明人:SHORT, Kevin M.,HONE, Brian T.,STACKLEY,

Scott,BRUNET, Pascal

申请号:EP15777029.8申请日:20150408公开号:EP3129795A1公开日:20170215

摘要:A method of processing a signal includes taking a signal recorded by a pluralityof signal recorders, applying at least one super-resolution technique to the signal toproduce an oscillator peak representation of the signal comprising a plurality offrequency components for a plurality of oscillator peaks, computing at least one CrossChannel Complex Spectral Phase Evolution (XCSPE) attribute for the signal to produce ameasure of a spatial evolution of the plurality of oscillator peaks between the signal,identifying a known predicted XCSPE curve (PXC) trace corresponding to the frequencycomponents and at least one XCSPE attribute of the plurality of oscillator peaks andutilizing the identified PXC trace to determine a spatial attribute corresponding to anorigin of the signal.

申请人:Kaonyx Labs, LLC

地址:12 Kent Way, Suite 210 Byfield, MA 01922 US

国籍:US

代理机构:Findlay, Alice Rosemary

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